Connor Glosner (Purdue University), Aravind Machiry (Purdue University)

Unified Extensible Firmware Interface (UEFI) specification describes a platform-independent pre-boot interface for an Operating System (OS). EDK-2 Vulnerabilities in UEFI interface functions have severe consequences and can lead to Bootkits and other persistent malware resilient to OS reinstallations. However, there exist no vulnerability detection techniques for UEFI interfaces. We present FUZZUER, a feedback-guided fuzzing technique for UEFI interfaces on EDK-2, an exemplary and prevalently used UEFI implementation. We designed FIRNESS that utilizes static analysis techniques to automatically generate fuzzing harnesses for interface functions. We evaluated FUZZUER on the latest version of EDK-2. Our comprehensive evaluation on 150 interface functions demonstrates that FUZZUER with FIRNESS is an effective testing technique of EDK-2’s UEFI interface functions, greatly outperforming HBFA, an existing testing tool with manually written harnesses. We found 20 new security vulnerabilities, and most of these are already acknowledged by the developers.

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DiStefano: Decentralized Infrastructure for Sharing Trusted Encrypted Facts and...

Sofia Celi (Brave Software), Alex Davidson (NOVA LINCS & Universidade NOVA de Lisboa), Hamed Haddadi (Imperial College London & Brave Software), Gonçalo Pestana (Hashmatter), Joe Rowell (Information Security Group, Royal Holloway, University of London)

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Decoupling Permission Management from Cryptography for Privacy-Preserving Systems

Ruben De Smet (Department of Engineering Technology (INDI), Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel), Tom Godden (Department of Engineering Technology (INDI), Vrije Universiteit Brussel), Kris Steenhaut (Department of Engineering Technology (INDI), Department of Electronics and Informatics (ETRO), Vrije Universiteit Brussel), An Braeken (Department of Engineering Technology (INDI), Vrije Universiteit Brussel)

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LightAntenna: Characterizing the Limits of Fluorescent Lamp-Induced Electromagnetic Interference

Fengchen Yang (Zhejiang University), Wenze Cui (Zhejiang University), Xinfeng Li (Zhejiang University), Chen Yan (Zhejiang University), Xiaoyu Ji (Zhejiang University), Wenyuan Xu (Zhejiang University)

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