David Balenson (SRI International)

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Reflections on Artifact Evaluation

Dr. Eric Eide (University of Utah)

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DRAWN APART: A Device Identification Technique based on Remote...

Tomer Laor (Ben-Gurion Univ. of the Negev), Naif Mehanna and Antonin Durey (Univ. Lille / Inria), Vitaly Dyadyuk (Ben-Gurion Univ. of the Negev), Pierre Laperdrix (CNRS, Univ. Lille, Inria Lille), Clémentine Maurice (CNRS), Yossi Oren (Ben-Gurion Univ. of the Negev), Romain Rouvoy (Univ. Lille / Inria / IUF), Walter Rudametkin (Univ. Lille / Inria), Yuval…

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