Mohit Kumar Jangid (The Ohio State University), Yue Zhang (Computer Science & Engineering, Ohio State University), Zhiqiang Lin (The Ohio State University)

Bluetooth is a leading wireless communication technology used by billions of Internet of Things (IoT) devices today. Its ubiquity demands systematic security scrutiny. A key ingredient in Bluetooth security is secure pairing, which includes Numeric comparison (NC) and Passkey Entry (PE). However, most prior formal efforts have considered only NC, and PE has not yet been formally studied in depth. In this paper, we propose a detailed formal analysis of the PE protocol. In particular, we present a generic formal model, built using Tamarin, to verify the security of PE by precisely capturing the protocol behaviors and attacker capabilities. Encouragingly, it rediscovers three known attacks (confusion attacks, static passcode attacks, and reflection attacks), and more importantly, also uncovers two new attacks (group guessing attacks and ghost attacks) spanning across diverse attack vectors (e.g., static variable reuse, multi-threading, reflection, human error, and compromise device). Finally, after applying fixes to each vulnerability, our model further proves the confidentiality and authentication properties of the PE protocol using an inductive base model.

View More Papers

No Grammar, No Problem: Towards Fuzzing the Linux Kernel...

Alexander Bulekov (Boston University), Bandan Das (Red Hat), Stefan Hajnoczi (Red Hat), Manuel Egele (Boston University)

Read More

InfoMasker: Preventing Eavesdropping Using Phoneme-Based Noise

Peng Huang (Zhejiang University), Yao Wei (Zhejiang University), Peng Cheng (Zhejiang University), Zhongjie Ba (Zhejiang University), Li Lu (Zhejiang University), Feng Lin (Zhejiang University), Fan Zhang (Zhejiang University), Kui Ren (Zhejiang University)

Read More

Access Your Tesla without Your Awareness: Compromising Keyless Entry...

Xinyi Xie (Shanghai Fudan Microelectronics Group Co., Ltd.), Kun Jiang (Shanghai Fudan Microelectronics Group Co., Ltd.), Rui Dai (Shanghai Fudan Microelectronics Group Co., Ltd.), Jun Lu (Shanghai Fudan Microelectronics Group Co., Ltd.), Lihui Wang (Shanghai Fudan Microelectronics Group Co., Ltd.), Qing Li (State Key Laboratory of ASIC & System, Fudan University), Jun Yu (State Key…

Read More