Thomas Dullien

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Binary Mutation Analysis of Tests Using Reassembleable Disassembly

Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)

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Finding 1-Day Vulnerabilities in Trusted Applications using Selective Symbolic...

Marcel Busch (Friedrich-Alexander-Universität Erlangen-Nürnberg), Kalle Dirsch (Friedrich-Alexander-Universität Erlangen-Nürnberg)

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