Olsan Ozbay (Dept. ECE, University of Maryland), Yuntao Liu (ISR, University of Maryland), Ankur Srivastava (Dept. ECE, ISR, University of Maryland)

Electromagnetic (EM) side channel attacks (SCA) have been very powerful in extracting secret information from hardware systems. Existing attacks usually extract discrete values from the EM side channel, such as cryptographic key bits and operation types. In this work, we develop an EM SCA to extract continuous values that are being used in an averaging process, a common operation used in federated learning. A convolutional neural network (CNN) framework is constructed to analyze the collected EM data. Our results show that our attack is able to distinguish the distributions of the underlying data with up to 93% accuracy, indicating that applications previously considered as secure, such as federated learning, should be protected from EM side-channel attacks in their implementation.

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Towards Real-time Voice Interaction Data Collection Monitoring and Ambient...

Tu Le (University of California, Irvine), Zixin Wang (Zhejiang University), Danny Yuxing Huang (New York University), Yaxing Yao (Virginia Tech), Yuan Tian (University of California, Los Angeles)

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TEE-SHirT: Scalable Leakage-Free Cache Hierarchies for TEEs

Kerem Arikan (Binghamton University), Abraham Farrell (Binghamton University), Williams Zhang Cen (Binghamton University), Jack McMahon (Binghamton University), Barry Williams (Binghamton University), Yu David Liu (Binghamton University), Nael Abu-Ghazaleh (University of California, Riverside), Dmitry Ponomarev (Binghamton University)

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EMMasker: EM Obfuscation Against Website Fingerprinting

Mohammed Aldeen, Sisheng Liang, Zhenkai Zhang, Linke Guo (Clemson University), Zheng Song (University of Michigan – Dearborn), and Long Cheng (Clemson University)

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Aligning Confidential Computing with Cloud-native ML Platforms

Angelo Ruocco, Chris Porter, Claudio Carvalho, Daniele Buono, Derren Dunn, Hubertus Franke, James Bottomley, Marcio Silva, Mengmei Ye, Niteesh Dubey, Tobin Feldman-Fitzthum (IBM Research)

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