Johnathan Wilkes, John Anny (Palo Alto Networks)

By embracing automation, organizations can transcend manual limitations to reduce mean time to response and address exposures consistently across their cybersecurity infrastructure. In the dynamic realm of cybersecurity, swiftly addressing externally discovered exposures is paramount, as each represents a ticking time bomb. A paradigm shift towards automation to enhance speed, efficiency, and uniformity in the remediation process is needed to answer the question, "You found the exposure, now what?". Traditional manual approaches are not only time-consuming but also prone to human error, underscoring the need for a comprehensive, automated solution. Acknowledging the diversity of exposures and the array of security tools, we will propose how to remediate common external exposures, such as open ports and dangling domains. The transformative nature of this shift is crucial, particularly in the context of multiple cloud platforms with distinct data enrichment and remediation capabilities.

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Designing and Evaluating a Testbed for the Matter Protocol:...

Ravindra Mangar (Dartmouth College) Jingyu Qian (University of Illinois), Wondimu Zegeye (Morgan State University), Abdulrahman AlRabah, Ben Civjan, Shalni Sundram, Sam Yuan, Carl A. Gunter (University of Illinois), Mounib Khanafer (American University of Kuwait), Kevin Kornegay (Morgan State University), Timothy J. Pierson, David Kotz (Dartmouth College)

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Efficient and Timely Revocation of V2X Credentials

Gianluca Scopelliti (Ericsson & KU Leuven), Christoph Baumann (Ericsson), Fritz Alder (KU Leuven), Eddy Truyen (KU Leuven), Jan Tobias Mühlberg (Université libre de Bruxelles & KU Leuven)

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MASTERKEY: Automated Jailbreaking of Large Language Model Chatbots

Gelei Deng (Nanyang Technological University), Yi Liu (Nanyang Technological University), Yuekang Li (University of New South Wales), Kailong Wang (Huazhong University of Science and Technology), Ying Zhang (Virginia Tech), Zefeng Li (Nanyang Technological University), Haoyu Wang (Huazhong University of Science and Technology), Tianwei Zhang (Nanyang Technological University), Yang Liu (Nanyang Technological University)

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