Davide Rusconi (University of Milan), Osama Yousef (University of Milan), Mirco Picca (University of Milan), Danilo Bruschi (University of Milan), Flavio Toffalini (Ruhr-Universitat Bochum),  Andrea Lanzi (University of Milan)

In this paper, we show E-FuzzEdge, a novel fuzzing architecture targeted towards improving the throughput of fuzzing campaigns in contexts where scalability is unavailable. E-FuzzEdge addresses the inefficiencies of hardware-in-the-loop fuzzing for microcontrollers by optimizing execution speed. We evaluated our system against both real-world embedded libraries and state-of-the-art benchmarks, demonstrating significant performance improvements. A key advantage of the E-FuzzEdge architecture is its compatibility with other embedded fuzzing techniques that perform on device testing instead of firmware emulation. This means that the broader embedded fuzzing community can integrate E-FuzzEdge into their workflows to enhance overall testing efficiency.

View More Papers

Assessing Supply Chain Risks in 5G O-RAN Components Using...

Himashveta Kumar (The Pennsylvania State University), Tianchang Yang (The Pennsylvania State University), Arupjyoti Bhuyan (Idaho National Laboratory), Syed Rafiul Hussain (The Pennsylvania State University)

Read More

“Security issues should be addressed immediately regardless of who...

Tamara Bondar (Carleton University), Hala Assal (Carleton University)

Read More

Tickets to Hide: An Inside Look into the Anti-Abuse...

Hugo Bijmans (Delft University of Technology), Michel Van Eeten (Delft University of Technology), Rolf van Wegberg (Delft University of Technology)

Read More