Eman Maali (Imperial College London), Omar Alrawi (Georgia Institute of Technology), Julie McCann (Imperial College London)

With the proliferation of IoT devices, network device identification is essential for effective network management and security. Many exhibit performance degradation despite the potential of machine learning-based IoT device identification solutions. Degradation arises from the assumption of static IoT environments that do not account for the diversity of real-world IoT networks, as devices operate in various modes and evolve over time. In this paper, we evaluate current IoT device identification solutions using curated datasets and representative features across different settings. We consider key factors that affect real-world device identification, including modes of operation, spatio-temporal variations, and traffic sampling, and organise them into a set of attributes by which we can evaluate current solutions. We then use machine learning explainability techniques to pinpoint the key causes of performance degradation. This evaluation uncovers empirical evidence of what continuously identifies devices, provides valuable insights, and practical recommendations for network operators to improve their IoT device identification in operational deployments.

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K Sowjanya (Indian Institute of Technology Delhi), Rahul Saini (Eindhoven University of Technology), Dhiman Saha (Indian Institute of Technology Bhilai), Kishor Joshi (Eindhoven University of Technology), Madhurima Das (Indian Institute of Technology Delhi)

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Jens Christian Opdenbusch (Ruhr University Bochum), Jonas Hielscher (Ruhr University Bochum), M. Angela Sasse (Ruhr University Bochum, University College London)

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Miaoqian Lin (Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China; School of Cyber Security, University of Chinese Academy of Sciences, China), Kai Chen (Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China; School of Cyber Security, University of Chinese Academy of Sciences, China), Yi Yang (Institute of Information Engineering, Chinese Academy of…

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Ghidra: Is Newer Always Better?

Jonathan Crussell (Sandia National Laboratories)

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