Maximilian Golla, Jan Rimkus (Ruhr University Bochum); Adam J. Aviv (United States Naval Academy); Markus Dürmuth (Ruhr University Bochum)
Work in Progress: On the In-Accuracy and Influence of Android Pattern Strength Meters
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On-demand RFID: Improving Privacy, Security, and User Trust in...
Youngwook Do (JPMorganChase and Georgia Institute of Technology), Tingyu Cheng (Georgia Institute of Technology and University of Notre Dame), Yuxi Wu (Georgia Institute of Technology and Northeastern University), HyunJoo Oh(Georgia Institute of Technology), Daniel J. Wilson (Northeastern University), Gregory D. Abowd (Northeastern University), Sauvik Das (Carnegie Mellon University)
Read MoreTowards Real-time Voice Interaction Data Collection Monitoring and Ambient...
Tu Le (University of California, Irvine), Zixin Wang (Zhejiang University), Danny Yuxing Huang (New York University), Yaxing Yao (Virginia Tech), Yuan Tian (University of California, Los Angeles)
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