Maximilian Golla, Jan Rimkus (Ruhr University Bochum); Adam J. Aviv (United States Naval Academy); Markus Dürmuth (Ruhr University Bochum)
Work in Progress: On the In-Accuracy and Influence of Android Pattern Strength Meters
View More Papers
From Awareness to Practice: A Survey of U.S. Users’...
Ece Gumusel (University of Illinois Urbana-Champaign), Yueru Yan (Indiana University Bloomington), Ege Otenen (Indiana University Bloomington)
Read MoreVision: Towards Fully Shoulder-Surfing Resistant and Usable Authentication for...
Tobias Länge (Karlsruhe Institute of Technology), Philipp Matheis (Karlsruhe Institute of Technology), Reyhan Düzgün (Ruhr University Bochum), Melanie Volkamer (Karlsruhe Institute of Technology), Peter Mayer (Karlsruhe Institute of Technology, University of Southern Denmark)
Read More