Maximilian Golla, Jan Rimkus (Ruhr University Bochum); Adam J. Aviv (United States Naval Academy); Markus Dürmuth (Ruhr University Bochum)
Work in Progress: On the In-Accuracy and Influence of Android Pattern Strength Meters
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Youngwook Do (JPMorganChase and Georgia Institute of Technology), Tingyu Cheng (Georgia Institute of Technology and University of Notre Dame), Yuxi Wu (Georgia Institute of Technology and Northeastern University), HyunJoo Oh(Georgia Institute of Technology), Daniel J. Wilson (Northeastern University), Gregory D. Abowd (Northeastern University), Sauvik Das (Carnegie Mellon University)
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Nyteisha Bookert, Mohd Anwar (North Carolina Agricultural and Technical State University)
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Michelle P. Steves, Kristen K. Greene, Mary F. Theofanos (National Institute of Standards and Technology)
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Hao-Ping (Hank) Lee (Carnegie Mellon University), Wei-Lun Kao (National Taiwan University), Hung-Jui Wang (National Taiwan University), Ruei-Che Chang (University of Michigan), Yi-Hao Peng (Carnegie Mellon University), Fu-Yin Cherng (National Chung Cheng University), Shang-Tse Chen (National Taiwan University)
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