Maximilian Golla, Jan Rimkus (Ruhr University Bochum); Adam J. Aviv (United States Naval Academy); Markus Dürmuth (Ruhr University Bochum)
Work in Progress: On the In-Accuracy and Influence of Android Pattern Strength Meters
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On-demand RFID: Improving Privacy, Security, and User Trust in...
Youngwook Do (JPMorganChase and Georgia Institute of Technology), Tingyu Cheng (Georgia Institute of Technology and University of Notre Dame), Yuxi Wu (Georgia Institute of Technology and Northeastern University), HyunJoo Oh(Georgia Institute of Technology), Daniel J. Wilson (Northeastern University), Gregory D. Abowd (Northeastern University), Sauvik Das (Carnegie Mellon University)
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Shakthidhar Reddy Gopavaram (Indiana University), Jayati Dev (Indiana University), Marthie Grobler (CSIRO’s Data61), DongInn Kim (Indiana University), Sanchari Das (University of Denver), L. Jean Camp (Indiana University)
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Shijing He (King’s College London), Yaxiong Lei (University of St Andrews), Xiao Zhan (Universitat Politecnica de Valencia), Ruba Abu-Salma (King’s College London), Jose Such (INGENIO (CSIC-UPV))
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