Dr. Sergey Bratus, DARPA PI and Research Associate Professor at Dartmouth College

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Binary Mutation Analysis of Tests Using Reassembleable Disassembly

Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)

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DRAWN APART: A Device Identification Technique based on Remote...

Tomer Laor (Ben-Gurion Univ. of the Negev), Naif Mehanna and Antonin Durey (Univ. Lille / Inria), Vitaly Dyadyuk (Ben-Gurion Univ. of the Negev), Pierre Laperdrix (CNRS, Univ. Lille, Inria Lille), Clémentine Maurice (CNRS), Yossi Oren (Ben-Gurion Univ. of the Negev), Romain Rouvoy (Univ. Lille / Inria / IUF), Walter Rudametkin (Univ. Lille / Inria), Yuval…

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Let’s Authenticate: Automated Certificates for User Authentication

James Conners (Brigham Young University), Corey Devenport (Brigham Young University), Stephen Derbidge (Brigham Young University), Natalie Farnsworth (Brigham Young University), Kyler Gates (Brigham Young University), Stephen Lambert (Brigham Young University), Christopher McClain (Brigham Young University), Parker Nichols (Brigham Young University), Daniel Zappala (Brigham Young University)

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