Eric Gustafson (UC Santa Barbara)
The State of Firmware Analysis (And What We're Doing About It)
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Binary Mutation Analysis of Tests Using Reassembleable Disassembly
Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)
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Keisuke Nishimura, Yuichi Sugiyama, Yuki Koike, Masaya Motoda, Tomoya Kitagawa, Toshiki Takatera, Yuma Kurogome (Ricerca Security, Inc.)
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