Eric Gustafson (UC Santa Barbara)
The State of Firmware Analysis (And What We're Doing About It)
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Binary Mutation Analysis of Tests Using Reassembleable Disassembly
Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)
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Yuhei Otsubo (National Police Agency, Tokyo, Japan), Akira Otsuka (Institute of information Security, Japan), Mamoru Mimura (National Defense Academy, Japan), Takeshi Sakaki (The University of Tokyo, Japan), Hiroshi Ukegawa (National Police Agency, Tokyo, Japan)
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Yun Zhang (Hunan University), Yuling Liu (Hunan University), Ge Cheng (Xiangtan University), Bo Ou (Hunan University)
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