Maximilian Eichhorn (Friedrich-Alexander-Universitat Erlangen-Nurnberg), Andreas Hammer (Friedrich-Alexander-Universitat Erlangen-Nurnberg), Gaston Pugliese (Friedrich-Alexander-Universitat Erlangen-Nurnberg), Felix Freiling (Friedrich-Alexander-Universitat Erlangen-Nurnberg)

Evidence from digital devices in general, and Internet of Things (IoT) and embedded devices in particular, plays an increasing role in modern investigations. Yet their diversity in hardware and software encumbers their analysis and analysis results appear fragmented and hard to assess. Investigators, therefore, face the challenge of finding and interpreting relevant digital evidence stored on these devices. In order to standardize the forensic analysis of digital devices and structure research results, we present the User–Device Interaction Model (UDIM), a device-centric formal model that is based on the types of interaction between a device, users, and other devices across interaction types and locations. By integrating the analysis results of 42 IoT devices from the literature, we show how UDIM supports standardized analysis, and helps law enforcement agencies prioritize resources during seizures. Furthermore, the model can be used to assess the coverage of forensic examinations, to ensure thoroughness and completeness of investigations.

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Behrad Tajalli (Radboud University), Stefanos Koffas (Delft University of Technology), Stjepan Picek (Radboud University)

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XR Devices Send WiFi Packets When They Should Not:...

Christopher Vattheuer (University of California, Los Angeles (UCLA)), Justin Feng (University of California, Los Angeles (UCLA)), Hossein Khalili (University of California, Los Angeles (UCLA)), Nader Sehatbakhsh (University of California, Los Angeles (UCLA)), Omid Abari (University of California, Los Angeles (UCLA))

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Ahmad ALBarqawi (New Jersey Institute of Technology, Newark, NJ, USA), Mahmoud Nazzal (Old Dominion University, Norfolk, VA, USA), Issa Khalil (Qatar Computing Research Institute (QCRI), HBKU, Doha, Qatar), Abdallah Khreishah (New Jersey Institute of Technology, Newark, NJ, USA), NhatHai Phan (New Jersey Institute of Technology, Newark, NJ, USA)

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