Jiameng Shi (University of Georgia), Wenqiang Li (Independent Researcher), Wenwen Wang (University of Georgia), Le Guan (University of Georgia)

Although numerous dynamic testing techniques have been developed, they can hardly be directly applied to firmware of deeply embedded (e.g., microcontroller-based) devices due to the tremendously different runtime environment and restricted resources on these devices. This work tackles these challenges by leveraging the unique position of microcontroller devices during firmware development. That is, firmware developers have to rely on a powerful engineering workstation that connects to the target device to program and debug code. Therefore, we develop a decoupled firmware testing framework named IPEA, which shifts the overhead of resource-intensive analysis tasks from the microcontroller to the workstation. Only lightweight “needle probes” are left in the firmware to collect internal execution information without processing it. We also instantiated this framework with a sanitizer based on pointer capability (IPEA-San) and a greybox fuzzer (IPEA-Fuzz). By comparing IPEA-San with a port of AddressSanitizer for microcontrollers, we show that IPEA-San reduces memory overhead by 62.75% in real-world firmware with better detection accuracy. Combining IPEA-Fuzz with IPEA-San, we found 7 zero-day bugs in popular IoT libraries (3) and peripheral driver code (4).

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Towards generic backward-compatible software upgrades for COSPAS-SARSAT EPIRB 406...

Ahsan Saleem (University of Jyväskylä, Finland), Andrei Costin (University of Jyväskylä, Finland), Hannu Turtiainen (University of Jyväskylä, Finland), Timo Hämäläinen (University of Jyväskylä, Finland)

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Acoustic Keystroke Leakage on Smart Televisions

Tejas Kannan (University of Chicago), Synthia Qia Wang (University of Chicago), Max Sunog (University of Chicago), Abraham Bueno de Mesquita (University of Chicago Laboratory Schools), Nick Feamster (University of Chicago), Henry Hoffmann (University of Chicago)

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TinyML meets IoBT against Sensor Hacking

Raushan Kumar Singh (IIT Ropar), Sudeepta Mishra (IIT Ropar)

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The CURE to Vulnerabilities in RPKI Validation

Donika Mirdita (Technische Universität Darmstadt), Haya Schulmann (Goethe-Universität Frankfurt), Niklas Vogel (Goethe-Universität Frankfurt), Michael Waidner (Technische Universität Darmstadt, Fraunhofer SIT)

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