Davide Rusconi (University of Milan), Osama Yousef (University of Milan), Mirco Picca (University of Milan), Danilo Bruschi (University of Milan), Flavio Toffalini (Ruhr-Universitat Bochum),  Andrea Lanzi (University of Milan)

In this paper, we show E-FuzzEdge, a novel fuzzing architecture targeted towards improving the throughput of fuzzing campaigns in contexts where scalability is unavailable. E-FuzzEdge addresses the inefficiencies of hardware-in-the-loop fuzzing for microcontrollers by optimizing execution speed. We evaluated our system against both real-world embedded libraries and state-of-the-art benchmarks, demonstrating significant performance improvements. A key advantage of the E-FuzzEdge architecture is its compatibility with other embedded fuzzing techniques that perform on device testing instead of firmware emulation. This means that the broader embedded fuzzing community can integrate E-FuzzEdge into their workflows to enhance overall testing efficiency.

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Yingjie Cao (Sun Yat-sen University and The Hong Kong Polytechnic University), Xiaogang Zhu (Adelaide University), Dean Sullivan (University of New Hampshire, US), Haowei Yang, Lei Xue (Sun Yat-sen University), Xian Li (Swinburne University of Technology, Australia), Chenxiong Qian (University of Hong Kong, China), Minrui Yan (Swinburne University of Technology, Australia), Xiapu Luo (The Hong Kong…

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Ghazal Abdollahi (University of Utah), Hamid Asadi (University of Utah), Robert Ricci (University of Utah)

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Yinhao Hu (Huazhong University of Science and Technology & Zhongguancun Laboratory), Pengyu Ding (Huazhong University of Science and Technology & Zhongguancun Laboratory), Zhenpeng Lin (Independent Researcher), Dongliang Mu (Huazhong University of Science and Technology), Yuan Li (Zhongguancun Laboratory)

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